Title :
Comments on "A Quick Accurate Method to Measure the Dielectric Constant of Microwave Integrated-Circuit Substrates" [Letters]
Author :
Ladbrooke, P.H. ; Potok, M.H.N. ; England, E.H.
Keywords :
Apertures; Conformal mapping; Dielectric constant; Dielectric losses; Dielectric measurements; Dielectric substrates; Image segmentation; Microwave measurements; Microwave theory and techniques; Resonant frequency;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1973.1128069
