DocumentCode :
905021
Title :
Field- and photon-enhanced field emission from thin-film field-emission devices
Author :
Akram-Husain, S. ; Walsh, Declan
Author_Institution :
University of Oxford, Engineering Laboratory, Oxford, UK
Volume :
4
Issue :
16
fYear :
1968
Firstpage :
339
Lastpage :
341
Abstract :
Thin-film sandwich devices of CdS-SiO-metal have been made. They have current/voltage behaviour characteristics of field emission from semiconductors. With reverse bias, the current is very much smaller. The field-emission current is greatly enhanced by illuminating the device with 2.41 and 2.54eV photons (from an argon-ion laser). Under pulsed laser excitation (pulse duration 1 ¿s) the enhanced emission persisted for more than 20ms. These experiments are analogous to some previous work on vacuum field emission. A possible mechanism for the enhanced emission is discussed.
Keywords :
engineering management; thin films;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19680265
Filename :
4233514
Link To Document :
بازگشت