DocumentCode
905413
Title
The Effects of Package Parasitics on the Stability of Microwave Negative Resistance Devices
Author
Monroe, John W.
Volume
21
Issue
11
fYear
1973
fDate
11/1/1973 12:00:00 AM
Firstpage
731
Lastpage
735
Abstract
The results of investigations of the effect of parasitic package elements on the behavior of negative resistance amplifiers are presented. Three different package styles were considered. Also two different lead configurations were used. The packages were all mounted in 7-mm coaxial transmission line. The impedance of packages with and without leads was measured from 4 to 18 GHz using a manual network analyzer. These data were used as the basis for calculations to determine the values of elements in a simple three-element equivalent circuit model of the package. Using the equivalent circuit model experimentally derived for each package style, the impedance seen by the chip through the package to a 50-Ω load was calculated. Broad-band curves of the impedance seen by the chip are presented. The experimentally derived model of the package permits matching of chip and package for stability.
Keywords
Bonding; Ceramics; Circuit stability; Coaxial components; Electrical resistance measurement; Impedance measurement; Microwave devices; Packaging; Tellurium; Transmission line measurements;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.1973.1128118
Filename
1128118
Link To Document