Title :
Broad-Band Microwave Measurements on GaAs "Traveling-Wave" Transistors
Author :
Dean, Raymond H. ; Dreeben, Arthur B. ; Hughes, John J. ; Matarese, Ralph J. ; Napoli, Louis S.
fDate :
12/1/1973 12:00:00 AM
Abstract :
Instantaneous gain, noise figure, reverse attenuation, and gain and phase control measurements in the frequency range 8-18 GHz have been performed on GaAs traveling-wave transistors. The broad-band high-gain nature of the device together with the requirement for several bias connections precluded the use of standard test fixtures, and resulted in a package design exhibiting less than 1-dB insertion loss over the band together with 75- to 90-dB internal isolation. Untuned X-band gain, noise figure, and reverse attenuation were 12 dB, 18 dB, and 32 dB, respectively, and the gain and phase could be electronically varied over a 35-dB and 360° range. When RF tuning was employed, the gain, on the average, improved by 10 dB.
Keywords :
Attenuation measurement; Frequency measurement; Gain measurement; Gallium arsenide; Microwave devices; Microwave measurements; Microwave transistors; Noise figure; Performance gain; Phase control;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1973.1128135