• DocumentCode
    906091
  • Title

    Pure-mode loci in piezoelectric plate resonators: application to materials evaluation in class 4 mm

  • Author

    Kosinski, John A. ; Lu, Yicheng ; Ballato, Arthur

  • Author_Institution
    US Army Res. Lab., Fort Monmouth, NJ, USA
  • Volume
    40
  • Issue
    3
  • fYear
    1993
  • fDate
    5/1/1993 12:00:00 AM
  • Firstpage
    258
  • Lastpage
    264
  • Abstract
    The accuracy of piezoelectric material evaluations can be enhanced by the use of pure-mode orientations, provided that exact analytic expressions for the pure-mode eigenvalues are known. The accuracy is enhanced by eliminating the need to extract constants from the differences in sums and products of measured quantities. It is necessary to adopt an approach for determining pure-mode loci in piezoelectric crystals which yields simple analytic expressions for the stiffness eigenvalues and provides a convenient engineering methodology for pure-mode sample set selection. The theory of simple thickness modes in piezoelectric plate vibrators is reviewed. The determination of pure-mode loci and its application to pure-mode sample set selection for dilithium tetraborate are presented. Thickness- and lateral-field excitation considerations are discussed.<>
  • Keywords
    crystal resonators; eigenvalues and eigenfunctions; lithium compounds; matrix algebra; piezoelectric materials; piezoelectric oscillations; Li/sub 2/B/sub 4/O/sub 7/; engineering methodology; lateral-field excitation; matrix notation; piezoelectric material evaluations; piezoelectric plate resonators; pure-mode eigenvalues; pure-mode loci; pure-mode orientations; pure-mode sample set selection; stiffness eigenvalues; thickness modes; Acoustic measurements; Acoustic waves; Crystalline materials; Crystals; Data analysis; Eigenvalues and eigenfunctions; Frequency measurement; Piezoelectric effect; Piezoelectric materials; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.216839
  • Filename
    216839