• DocumentCode
    906254
  • Title

    Semiconductor Device Simulation

  • Author

    Lee, Charles M. ; Lomax, Ronald J. ; Haddad, George I.

  • Volume
    22
  • Issue
    3
  • fYear
    1974
  • fDate
    3/1/1974 12:00:00 AM
  • Firstpage
    160
  • Lastpage
    177
  • Abstract
    Two of the numerical methods most widely used in solving the set of partial differential transport equations for holes, electrons, and electric field in semiconductor devices and the various numerical instability phenomena which can be encountered are described in detail. Also presented are approaches, using these methods, to calculate dc static solutions and small-signal solutions, and to simulate devices in voltage-driven, current-driven, and circuit-loaded operation. Sample results are given for each mode of operation for the case of Si avalanche-diode oscillators. The numerical methods and approaches are those developed at our laboratory and sufficient detail is presented to permit the development of similar Fortran codes by others.
  • Keywords
    Charge carrier processes; Difference equations; Differential equations; Electrons; Laboratories; Nonlinear equations; Partial differential equations; Physics; Poisson equations; Semiconductor devices;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1974.1128198
  • Filename
    1128198