Title :
Fast Readout of CCD Images
Author_Institution :
Lawrence Berkeley Laboratory University of California Berkeley, California 94720 U.S.A.
Abstract :
A new fast serial readout system for CCD imaging devices is described. Clock frequency of up to 65 MHz and 1 ¿s line transfer time make possible frame rates of approximately 500/s. A baseline stabilized video amplifier and fast peak stretcher also make possible high resolution frame readout with excellent dynamic range. It uses a fast dump readout sequence which clears the analog registers prior to the image charge transfer from the photoelements. The charge of any preset pixel can be individually extracted, its peak stretched, and the noise distribution measured by a multichannel pulse-height analyzer. Photographs of test pattern readouts at high clock frequencies are shown and the effect of clock and frame readout rates and temperature on noise distribution have been measured.
Keywords :
Charge coupled devices; Charge measurement; Charge transfer; Clocks; Current measurement; Dynamic range; Frequency; High-resolution imaging; Noise measurement; Pulse measurements;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1985.4336899