• DocumentCode
    906551
  • Title

    Computation of Dielectric Properties from Short-Circuited Waveguide Measurements on High- or Low-Loss Materials (Computer Program Descriptions)

  • Author

    Nelson, S.O.

  • Volume
    22
  • Issue
    3
  • fYear
    1974
  • fDate
    3/1/1974 12:00:00 AM
  • Firstpage
    342
  • Lastpage
    343
  • Abstract
    Computation of the relative complex permittivity components εr´ and εr´´ loss tangent, and conductivity from measurements data on materials in coaxial, rectangular, or cylindrical waveguides.
  • Keywords
    Coaxial components; Conducting materials; Conductivity measurement; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Loss measurement; Permittivity measurement; Rectangular waveguides; Waveguide components;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1974.1128224
  • Filename
    1128224
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=906551