Title :
On the relation between microwave series resistance, capacitance, and output power of IMPATT diodes
Author :
van Iperen, B.B. ; Tjassens, H. ; Goedbloed, J.J.
fDate :
7/1/1969 12:00:00 AM
Abstract :
Measurements at X-band of capacitance C, microwave series resistance R, and CW output power P, on Si IMPATT diodes with epitaxial layers of varying thickness are used to show that P = (constant)/(RC2). This relation is known from the large-signal theory of the ideal Read structure, but is found to be valid far beyond its theoretical limits.
Keywords :
Capacitance; Current measurement; Diodes; Electrical resistance measurement; Epitaxial layers; Microwave measurements; Power generation; Power measurement; Substrates; Thickness measurement;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1969.7268
