Title :
CuS thin films on flexible substrates
Author :
Pala, N. ; Rumyantsev, S.L. ; Sinius, J. ; Talapatra, S. ; Shur, M.S. ; Gaska, R.
Author_Institution :
Sensor Electron. Technol., Columbia, SC, USA
Abstract :
A report is presented on the electrical and structural properties of Cu7S4 films deposited on polyimide substrate at temperatures close to room temperature using the water solutions of complex-salt compounds. The X-ray diffraction data identified Cu7S4 crystalline monoclinic structure. The resistance of the film increased by 350% under tensile strain and by 5% under compressive strain. Maximal value of the gauge factor was found to be G≃103.
Keywords :
X-ray diffraction; copper compounds; electric resistance; liquid phase deposited coatings; semiconductor materials; semiconductor thin films; 293 to 298 K; CU7S4 films; Cu7S4; CuS thin flims; X-ray diffraction; complex-salt compounds; compressive strain; crystalline monoclinic structure; electric resistance; electrical properties; flexible substrates; gauge factor; polyimide substrate; room temperature; structural properties; tensile strain;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20040192
