• DocumentCode
    906941
  • Title

    X-Ray Absorption Spectroscopy Study of Annealing Effect on Co-Implanted ZnO Epitaxial Films

  • Author

    Liao, Y.F. ; Huang, T.W. ; Huang, J.C.A. ; Lee, C.H.

  • Author_Institution
    Dept. of Eng. & Syst. Sci., Nat. Tsing-Hua Univ., Hsinchu
  • Volume
    45
  • Issue
    6
  • fYear
    2009
  • fDate
    6/1/2009 12:00:00 AM
  • Firstpage
    2431
  • Lastpage
    2434
  • Abstract
    Room temperature diluted ferromagnetic semiconductor is a very promising candidate for spintronics applications. In this work, we present the cobalt ion implanted ZnO epitaxial thin film under controlled annealing temperature to investigate the origin of ferromagnetism in this system. For the as-implanted sample a metallic cobalt cluster was observed. After annealing at 700degC, the Co atoms were to substitute the Zn sites of the ZnO matrix and exhibited a spontaneous room temperature ferromagnetism. However the XMCD measurements on the annealed samples show the cobalt element is almost paramagnetism at 26 K. The result might indicate oxygen vacancies caused ferromagnetism of intrinsic dilute magnetic semiconductors in the sample of the Co-implanted ZnO.
  • Keywords
    II-VI semiconductors; X-ray absorption spectra; annealing; doping profiles; ferromagnetic materials; ion implantation; magnetic epitaxial layers; magnetoelectronics; semiconductor doping; semiconductor epitaxial layers; semimagnetic semiconductors; vacancies (crystal); wide band gap semiconductors; zinc compounds; X-ray absorption spectroscopy; ZnO:Co; annealing effect; doping; epitaxial film; intrinsic dilute magnetic semiconductors; ion implantation; oxygen vacancies; paramagnetism; room temperature diluted ferromagnetic semiconductor; spintronics application; temperature 26 K; temperature 293 K to 298 K; temperature 700 C; Co-doped ZnO; magnetic circular dichroism (XMCD); magnetic semiconductors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2009.2018598
  • Filename
    4957814