DocumentCode
907168
Title
Excess Surface Resistance Due to Surface Roughness at 35 GHz
Author
Tischer, Frederick J.
Volume
22
Issue
5
fYear
1974
fDate
5/1/1974 12:00:00 AM
Firstpage
566
Lastpage
569
Abstract
The increase of the surface resistance of plane copper surfaces caused by mechanically generated surface roughness has been determined at 35 GHz by measuring and evaluating the Q values of an H-guide cavity with removable sidewalls. The sidewalls were ground one-directionally by using abrasive papers of various grades to produce various degrees of roughness. The rms values of roughess were measured mechanically and optically after calibration by microphotography.
Keywords
Design methodology; Electrical resistance measurement; Filters; Frequency; Millimeter wave communication; Mirrors; Optical surface waves; Rough surfaces; Surface resistance; Surface roughness;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.1974.1128285
Filename
1128285
Link To Document