Title :
A New Method for Measuring Properties of Dielectric Materials Using a Microstrip Cavity (Short Papers)
fDate :
5/1/1974 12:00:00 AM
Abstract :
A new nondestructive method has been developed for measuring the dielectric constant and the loss factor of a slab-type material using a microstrip cavity. The method, which uses a simple and rapid substitution procedure, yields accurate results and has a number of advantages over currently available techniques. Experimental details and the theoretical basis are explained and experimental data are presented.
Keywords :
Dielectric constant; Dielectric materials; Dielectric measurements; Dielectric substrates; Diodes; Electromagnetic measurements; Electromagnetic waveguides; Frequency; Microstrip; Solid state circuits;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1974.1128287
