DocumentCode
907189
Title
A New Method for Measuring Properties of Dielectric Materials Using a Microstrip Cavity (Short Papers)
Author
Itoh, Tatsuo
Volume
22
Issue
5
fYear
1974
fDate
5/1/1974 12:00:00 AM
Firstpage
572
Lastpage
576
Abstract
A new nondestructive method has been developed for measuring the dielectric constant and the loss factor of a slab-type material using a microstrip cavity. The method, which uses a simple and rapid substitution procedure, yields accurate results and has a number of advantages over currently available techniques. Experimental details and the theoretical basis are explained and experimental data are presented.
Keywords
Dielectric constant; Dielectric materials; Dielectric measurements; Dielectric substrates; Diodes; Electromagnetic measurements; Electromagnetic waveguides; Frequency; Microstrip; Solid state circuits;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.1974.1128287
Filename
1128287
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