DocumentCode :
908303
Title :
Switch-level timing verification for CMOS circuits: a semianalytic approach
Author :
Yang, H.G. ; Holburn, D.M.
Author_Institution :
Dept. of Eng., Cambridge Univ., UK
Volume :
137
Issue :
6
fYear :
1990
fDate :
12/1/1990 12:00:00 AM
Firstpage :
405
Lastpage :
412
Abstract :
The authors describe a semianalytic slope delay model for CMOS switch-level timing verification. It is characterised by classification of the effects of the input slope, internal size and load capacitance of a logic gate on delay time, and then the use of a series of carefully chosen analytic functions to estimate delay times under different circumstances. In the field of VLSI analysis, this model achieves improvements in speed and accuracy compared with conventional approaches to transistor-level and switch-level simulation
Keywords :
CMOS integrated circuits; VLSI; delays; switching circuits; CMOS circuits; CMOS switch-level timing verification; VLSI analysis; analytic functions; delay time; distributed stage; input slope effect; internal size effect; load capacitance effect; logic gate; lumped stage; ring modulation; semianalytic approach; switch-level simulation; transistor-level;
fLanguage :
English
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings G
Publisher :
iet
ISSN :
0956-3768
Type :
jour
Filename :
217126
Link To Document :
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