DocumentCode :
908543
Title :
The Performance of an Amplitude Fourier Spectrometer for Far-Infrared Solid-State Spectroscopy
Author :
Gast, J. ; Genzel, L. ; Zwick, U.
Volume :
22
Issue :
12
fYear :
1974
fDate :
12/1/1974 12:00:00 AM
Firstpage :
1026
Lastpage :
1027
Abstract :
A far-infrared Fourier interferometer for amplitude-phase reflection spectroscopy on solids is described. It can be used with small samples at low temperatures and with fairly high resolution (<0.1 cm-1). The spectral range presently is 10-1000 cm-1.
Keywords :
Arm; Infrared spectra; Instruments; Mirrors; Optical interferometry; Optical reflection; Reflectivity; Solid state circuits; Spectroscopy; Temperature;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1974.1128420
Filename :
1128420
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=908543
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