• DocumentCode
    909002
  • Title

    Measurements of statistical burst-noise characteristics

  • Author

    Mulet, J. ; Luque, Antonio ; Rodriguez, Taniana

  • Author_Institution
    Instituto Politécnico de Madrid, Escuela Superior Telecomunicación, Madrid, Spain
  • Volume
    6
  • Issue
    13
  • fYear
    1970
  • Firstpage
    394
  • Lastpage
    395
  • Abstract
    In a previous letter, a dislocation model of planar-silicon-transistor burst noise was proposed. The burst statistical parameters have been measured and their dependence on bias is in good agreement with the model.
  • Keywords
    bipolar transistors; noise measurement;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19700278
  • Filename
    4234774
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=909002