Title :
Measurement of the Large-Signal Characteristics of Microwave Solid-State Devices Using an Injection-Locking Technique (Short Papers)
Author :
Young, J. C T ; Stephenson, I.M.
fDate :
12/1/1974 12:00:00 AM
Abstract :
A method for the measurement of the dynamic admittance and susceptance of "negative-resistance" diodes is described. The device under test is allowed to oscillate in a microwave cavity, and operated as an injection-locked oscillator. Injected locking signals of the same order as the free-running output power of the oscillator are used. The dynamic conductance and susceptance of the device are obtained from the phase and amplitude response of the system.
Keywords :
Admittance measurement; Diodes; Injection-locked oscillators; Microwave devices; Microwave measurements; Microwave oscillators; Microwave theory and techniques; Power generation; Solid state circuits; Testing;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1974.1128487
