DocumentCode
909352
Title
Radiation damage studies of a custom-designed VLSI readout chip
Author
Dauncey, Paul ; Barnett, Bruce A. ; Drewer, David ; Matthews, John A J ; Breakstone, Alan ; Parker, Sherwood ; Adolphsen, Chris ; Gratta, Giorgio ; Litke, Alan ; Schwarz, Andreas S. ; Turala, Michal ; Jacobsen, Robert ; Lüth, Vera
Author_Institution
Johns Hopkins Univ., Baltimore, MD, USA
Volume
35
Issue
1
fYear
1988
Firstpage
166
Lastpage
170
Abstract
Two structurally similar versions of an NMOS custom VLSI circuit, fabricated by different manufacturers, have been irradiated with a /sup 60/Co source up to doses of 100 krad. Large differences in their behavior after irradiation have been seen and are thought to be due to the fabrication processes. These differences are observed in test structure measurements and overall chip performance. An increase in circuit noise causes one version of the chip to be unusable after radiation doses of 20 krad.<>
Keywords
VLSI; gamma-ray effects; 20 krad; NMOS; chip performance; circuit noise; custom-designed VLSI readout chip; radiation doses; Circuit testing; Fabrication; MOS devices; Manufacturing; Protection; Semiconductor device measurement; Shift registers; Silicon; Very large scale integration; Voltage;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.12698
Filename
12698
Link To Document