Title :
Anomalous low-frequency noise enhancement beyond pinch-off in silicon n-channel MOS transistors
Author :
Nakahara, Mizuki ; Iwasawa, Hiroshi ; Yasutake, K.
Abstract :
Anomalous behavior of low-frequency noise is found in pinched-off n-channel silicon MOS transistors. A qualitative explanation is given.
Keywords :
Artificial intelligence; Bandwidth; Frequency measurement; Low-frequency noise; MOSFETs; Noise generators; Resistors; Silicon; Temperature; Threshold voltage;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1969.7525
