DocumentCode
909468
Title
Anomalous low-frequency noise enhancement beyond pinch-off in silicon n-channel MOS transistors
Author
Nakahara, Mizuki ; Iwasawa, Hiroshi ; Yasutake, K.
Volume
57
Issue
12
fYear
1969
Firstpage
2177
Lastpage
2178
Abstract
Anomalous behavior of low-frequency noise is found in pinched-off n-channel silicon MOS transistors. A qualitative explanation is given.
Keywords
Artificial intelligence; Bandwidth; Frequency measurement; Low-frequency noise; MOSFETs; Noise generators; Resistors; Silicon; Temperature; Threshold voltage;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1969.7525
Filename
1449455
Link To Document