• DocumentCode
    909468
  • Title

    Anomalous low-frequency noise enhancement beyond pinch-off in silicon n-channel MOS transistors

  • Author

    Nakahara, Mizuki ; Iwasawa, Hiroshi ; Yasutake, K.

  • Volume
    57
  • Issue
    12
  • fYear
    1969
  • Firstpage
    2177
  • Lastpage
    2178
  • Abstract
    Anomalous behavior of low-frequency noise is found in pinched-off n-channel silicon MOS transistors. A qualitative explanation is given.
  • Keywords
    Artificial intelligence; Bandwidth; Frequency measurement; Low-frequency noise; MOSFETs; Noise generators; Resistors; Silicon; Temperature; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1969.7525
  • Filename
    1449455