Title :
A Method for Measuring the Refractive Index Profile of Thin-Film Waveguide (Letters)
Author :
Mittra, R. ; Itoh, T.
fDate :
1/1/1975 12:00:00 AM
Abstract :
A method is described for determining the refractive index profile of an optical waveguide. AII optimization algorithm has been employed to obtain the index profile from the measured reflection coefficient data. Several numerical experiments have been performed to prove the accuracy of the present method. Some of the results are included.
Keywords :
Collimators; Dielectric losses; Optical reflection; Optical refraction; Optical scattering; Optical variables control; Optical waveguides; Performance analysis; Refractive index; Transistors;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1975.1128519
