• DocumentCode
    909551
  • Title

    A Method for Measuring the Refractive Index Profile of Thin-Film Waveguide (Letters)

  • Author

    Mittra, R. ; Itoh, T.

  • Volume
    23
  • Issue
    1
  • fYear
    1975
  • fDate
    1/1/1975 12:00:00 AM
  • Firstpage
    176
  • Lastpage
    177
  • Abstract
    A method is described for determining the refractive index profile of an optical waveguide. AII optimization algorithm has been employed to obtain the index profile from the measured reflection coefficient data. Several numerical experiments have been performed to prove the accuracy of the present method. Some of the results are included.
  • Keywords
    Collimators; Dielectric losses; Optical reflection; Optical refraction; Optical scattering; Optical variables control; Optical waveguides; Performance analysis; Refractive index; Transistors;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1975.1128519
  • Filename
    1128519
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=909551