Title :
Physical Science, Measurement and Instrumentation, Management and Education, IEE Proceedings A
Author :
Moruzzi, J.L. ; Cunliffe, R.
Author_Institution :
Dept. of Electr. Eng. & Electron., Liverpool Univ., UK
fDate :
3/1/1989 12:00:00 AM
Abstract :
A simple system is described that allows alignment of objects, to be better than 2.5 mu m, at distances of up to 25 m. The system uses a laser light source, a lateral cell as a detector and microprocessor technology, to produce a system that achieves this specification with no other optical elements. The system is insensitive to background light variations, is self-calibrating and has no detectable hysteresis.<>
Keywords :
calibration; computerised instrumentation; measurement by laser beam; optical systems; spatial variables measurement; 25 m; laser light source; microprocessor technology; optical alignment system; self-calibrating;
Journal_Title :
Physical Science, Measurement and Instrumentation, Management and Education, IEE Proceedings A