Title :
Quantitative Analysis of Alpha Activities in Thick Sources Using Si Detectors
Author :
Takami, Y. ; Hashimoto, T. ; Shiraishi, F. ; Voss, Keith
Author_Institution :
Institute for Atomic Energy, Rikkyo University, Nagasaka, Yokosuka, 240-01, Japan
Abstract :
An alpha spectroscopy method for thick sources was developed. Alpha energy spectrum measured at a plane surface of a thick source is inversely proportional to the dE/dx of the medium. This principle was applied to analyze alpha nuclides in low level environmental samples quantitatively, using a large area Si Surface Barrier Detector(SBD).
Keywords :
Alpha particles; Detectors; Electrodes; Energy measurement; Monitoring; Pollution measurement; Powders; Soil measurements; Spectroscopy; Surface contamination;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1986.4337183
