Title :
The Double-Swept-Frequency Locating Reflectometer (Short Papers)
Author :
Yamaura, Itsuo ; Hidaka, Takehiko
fDate :
3/1/1975 12:00:00 AM
Abstract :
A swept-frequency-type reflectometer is newly developed which is capable of measuring the distances to the reflection locations and reflection magnitudes in the coaxial line or waveguide, using a double-swept-frequency (DSF) source and a bandpass filter. The principle of this reflectometer and experimental results obtained at 2 GHz are given.
Keywords :
Band pass filters; Coaxial components; Frequency; Microwave oscillators; Reflection; Signal analysis; Signal generators; Spectral analysis; Time domain analysis; Transmission lines;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1975.1128556