• DocumentCode
    910183
  • Title

    A delay metric for RC circuits based on the Weibull distribution

  • Author

    Liu, F. ; Kashyap, C. ; Alpert, C.J.

  • Author_Institution
    IBM Austin Res. Lab., TX, USA
  • Volume
    23
  • Issue
    3
  • fYear
    2004
  • fDate
    3/1/2004 12:00:00 AM
  • Firstpage
    443
  • Lastpage
    447
  • Abstract
    Physical synthesis optimizations require fast and accurate analysis of RC networks. Elmore first proposed matching circuit moments to a probability density function (PDF), which led to widespread adoption of his simple and fast metric. The more recently proposed PRIMO and H-gamma metrics match the circuit moments to the PDF of a Gamma statistical distribution. We instead propose to match the circuit moments to a Weibull distribution and derive a new delay metric called Weibull-based delay (WED). The primary advantages of WED over PRIMO and H-gamma are its efficiency and ease of implementation. Experiments show that WED is robust and has satisfactory accuracy at both near- and far-end nodes.
  • Keywords
    Weibull distribution; circuit optimisation; circuit simulation; networks (circuits); Gamma statistical distribution; H-gamma metrics; PRIMO; RC circuits; RC network analysis; Weibull distribution; Weibull-based delay; delay metric; far-end node; matching circuit moments; near-end node; physical synthesis optimizations; probability density function; Circuit synthesis; Delay effects; Network synthesis; Probability density function; Propagation delay; RLC circuits; Robustness; Shape; Statistical distributions; Weibull distribution;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2004.823343
  • Filename
    1269867