Title :
Discriminating Among the Log-Normal, Weibull, and Generalized Exponential Distributions
Author :
Dey, Arabin Kumar ; Kundu, Debasis
Author_Institution :
Dept. of Math. & Stat., Indian Inst. of Technol. Kanpur, Kanpur, India
Abstract :
We consider model selection and discrimination among three important lifetime distributions. These three distributions have been used quite effectively to analyze lifetime data. We study the probability of correct selection using the maximized likelihood method, as it has been used in the literature. We further compute the asymptotic probability of correct selection, and compare the theoretical, and simulation results for different sample sizes, and for different model parameters. The results have been extended for Type-I censored data also. The theoretical, and simulation results match quite well. Two real data sets have been analyzed for illustrative purposes. We also suggest a method to determine the minimum sample size required to discriminate among the three distributions for a given probability of correct selection, and a user specified protection level.
Keywords :
Weibull distribution; exponential distribution; log normal distribution; maximum likelihood estimation; Weibull distribution; asymptotic probability; generalized exponential distribution; log-normal distribution; maximized likelihood method; Bivariate normal distribution; Kolmogorov-Smirnov distance; likelihood ratio test; model selection; probability of correct selection;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.2009.2019494