• DocumentCode
    910462
  • Title

    Discriminating Among the Log-Normal, Weibull, and Generalized Exponential Distributions

  • Author

    Dey, Arabin Kumar ; Kundu, Debasis

  • Author_Institution
    Dept. of Math. & Stat., Indian Inst. of Technol. Kanpur, Kanpur, India
  • Volume
    58
  • Issue
    3
  • fYear
    2009
  • Firstpage
    416
  • Lastpage
    424
  • Abstract
    We consider model selection and discrimination among three important lifetime distributions. These three distributions have been used quite effectively to analyze lifetime data. We study the probability of correct selection using the maximized likelihood method, as it has been used in the literature. We further compute the asymptotic probability of correct selection, and compare the theoretical, and simulation results for different sample sizes, and for different model parameters. The results have been extended for Type-I censored data also. The theoretical, and simulation results match quite well. Two real data sets have been analyzed for illustrative purposes. We also suggest a method to determine the minimum sample size required to discriminate among the three distributions for a given probability of correct selection, and a user specified protection level.
  • Keywords
    Weibull distribution; exponential distribution; log normal distribution; maximum likelihood estimation; Weibull distribution; asymptotic probability; generalized exponential distribution; log-normal distribution; maximized likelihood method; Bivariate normal distribution; Kolmogorov-Smirnov distance; likelihood ratio test; model selection; probability of correct selection;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2009.2019494
  • Filename
    4967912