DocumentCode
910533
Title
30-W/mm GaN HEMTs by field plate optimization
Author
Wu, Y.-F. ; Saxler, A. ; Moore, M. ; Smith, R.P. ; Sheppard, S. ; Chavarkar, P.M. ; Wisleder, T. ; Mishra, U.K. ; Parikh, P.
Author_Institution
Cree Santa Barbara Technol. Center, Goleta, CA, USA
Volume
25
Issue
3
fYear
2004
fDate
3/1/2004 12:00:00 AM
Firstpage
117
Lastpage
119
Abstract
GaN high-electron-mobility-transistors (HEMTs) on SiC were fabricated with field plates of various dimensions for optimum performance. Great enhancement in radio frequency (RF) current-voltage swings was achieved with acceptable compromise in gain, through both reduction in the trapping effect and increase in breakdown voltages. When biased at 120 V, a continuous wave output power density of 32.2 W/mm and power-added efficiency (PAE) of 54.8% at 4 GHz were obtained using devices with dimensions of 0.55×246 μm2 and a field-plate length of 1.1 μm. Devices with a shorter field plate of 0.9 μm also generated 30.6 W/mm with 49.6% PAE at 8 GHz. Such ultrahigh power densities are a dramatic improvement over the 10-12 W/mm values attained by conventional gate GaN-based HEMTs.
Keywords
III-V semiconductors; gallium compounds; microwave field effect transistors; microwave power transistors; power HEMT; semiconductor device breakdown; silicon compounds; wide band gap semiconductors; 120 V; 4 GHz; 8 GHz; GaN-SiC; HEMT; breakdown voltages; continuous wave output power density; current-voltage swings; field plate optimization; field plates; high-electron-mobility-transistors; power-added efficiency; radio frequency; trapping effect reduction; ultrahigh power densities; Cutoff frequency; Gallium nitride; HEMTs; High power microwave generation; III-V semiconductor materials; MODFETs; Microwave devices; Power generation; Radio frequency; Silicon carbide;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2003.822667
Filename
1269895
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