DocumentCode :
910608
Title :
A flexible 128 channel silicon strip detector instrumentation integrated circuit with sparse data readout
Author :
Kleinfelder, Stuart A. ; Carithers, William C., Jr. ; Ely, Robert P., Jr. ; Haber, Carl ; Kirsten, Frederick ; Spieler, Helmuth G.
Author_Institution :
Lawrence Berkeley Lab., Berkeley, CA, USA
Volume :
35
Issue :
1
fYear :
1988
Firstpage :
171
Lastpage :
175
Abstract :
A full-custom CMOS integrated circuit for silicon strip detector systems has been designed, fabricated, and tested. The circuit contains 128 parallel data-acquisition channels and considerable peripheral circuitry. Each channel consists of a low-noise, low-power, charge-sensitive amplifier, a multistage autobalanced comparator, an analog multiplexer, nearest-neighbor logic, priority-search logic, and a share of a position-encoding read-only memory. The analog system can substract both detector pedestal and leakage current on a channel-by-channel basis. A key feature of this design is the inclusion of on-chip sparse read-out circuitry, which allows efficient management of low-occupancy events. Designed for use at the Collider Detector Facility (CDF) at Fermilab, the circuit is suitable for large-scale silicon detector systems requiring a large, dense array of fast, low-power electronics.<>
Keywords :
CMOS integrated circuits; semiconductor counters; 128 parallel data-acquisition channels; Collider Detector Facility; Fermilab; Si strip detector; analog multiplexer; channel-by-channel basis; charge-sensitive amplifier; detector pedestal; full-custom CMOS integrated circuit; leakage current; low-noise; low-occupancy events; low-power; multistage autobalanced comparator; nearest-neighbor logic; on-chip sparse read-out circuitry; peripheral circuitry; position-encoding read-only memory; priority-search logic; sparse data readout; CMOS integrated circuits; CMOS logic circuits; Circuit testing; Detectors; Instruments; Integrated circuit testing; Low-noise amplifiers; Silicon; Strips; System testing;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.12699
Filename :
12699
Link To Document :
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