Title :
Impairment of noise immunity of digital monolithic integrated circuits caused by supply-line and earth-line current spikes in conjunction with coaxial-cable connections
Author :
Abdel-Latif, M. ; Strutt, M.J.O.
Author_Institution :
Swiss Federal Institute of Technology, Department of Advanced Electrical Engineering, Zurich, Switzerland
Abstract :
Voltage fluctuations generated on the common supply and earth lines of a digital system are caused mainly by capacitances of interconnecting coaxial cables and the self inductances of these common lines. This impairment of noise immunity can be eliminated by the addition of proper integrated m.o.s. capacitances.
Keywords :
coaxial cables; digital integrated circuits; interference suppression; monolithic integrated circuits; noise;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19700446
