• DocumentCode
    910752
  • Title

    IEEE 2004 International Integrated Reliability Workshop, Lake Tahoe, CA, October 18-21, 2004

  • Volume
    25
  • Issue
    3
  • fYear
    2004
  • fDate
    3/1/2004 12:00:00 AM
  • Firstpage
    159
  • Lastpage
    159
  • Abstract
    Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers.
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2004.825607
  • Filename
    1269910
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=910752