• DocumentCode
    910765
  • Title

    Traceable Waveform Calibration With a Covariance-Based Uncertainty Analysis

  • Author

    Hale, Paul D. ; Dienstfrey, Andrew ; Wang, Jiacheng ; Williams, Dylan F. ; Lewandowski, Andreas ; Keenan, D.A. ; Clement, Tracy S.

  • Author_Institution
    NIST, Boulder, CO, USA
  • Volume
    58
  • Issue
    10
  • fYear
    2009
  • Firstpage
    3554
  • Lastpage
    3568
  • Abstract
    We describe a method for calibrating the voltage that a step-like pulse generator produces at a load at every time point in the measured waveform. The calibration includes an equivalent-circuit model of the generator that can be used to determine how the generator behaves when it is connected to arbitrary loads. The generator is calibrated with an equivalent-time sampling oscilloscope and is traceable to fundamental physics via the electro-optic sampling system at the National Institute of Standards and Technology. The calibration includes a covariance-based uncertainty analysis that provides the uncertainty at each time in the waveform vector and the correlations between the uncertainties at the different times. From the calibrated waveform vector and its covariance matrix, we calculate pulse parameters and their uncertainties. We compare our method with a more traditional parameter-based uncertainty analysis.
  • Keywords
    calibration; covariance matrices; electro-optical devices; equivalent circuits; oscilloscopes; pulse generators; National Institute of Standards and Technology; covariance matrix; covariance-based uncertainty analysis; electro-optic sampling system; equivalent-circuit model; equivalent-time sampling oscilloscope; parameter-based uncertainty analysis; step-like pulse generator; traceable waveform calibration; voltage calibration; waveform vector; Covariance matrices; deconvolution; oscilloscopes; pulse measurements; signals; uncertainty; waveforms;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2009.2018012
  • Filename
    4967938