• DocumentCode
    911018
  • Title

    Investigation of etalon effects in GaAs-AlGaAs multiple quantum well modulators

  • Author

    Whitehead, M. ; Parry, G. ; Wheatley, P.

  • Author_Institution
    Dept. of Electron. Eng., Univ. Coll., London, UK
  • Volume
    136
  • Issue
    1
  • fYear
    1989
  • Firstpage
    52
  • Lastpage
    58
  • Abstract
    The authors have simulated the modulation properties in transmission and reflection of an electrically active Fabry-Perot etalon containing a GaAs-AlGaAs multiple quantum well pin structure. The calculations are based on measurements of room temperature electro-absorption in a nonresonant device, rather than an empirical model, and generate the optimum values of modulation for any given etalon by selection of the appropriate cavity length. It is found that improved modulation can be obtained compared to the non-resonant device, mainly due to multiple-pass electro-absorption. For example, a device with front and back mirror reflectivities of 0.3 and 0.9 respectively, and a 1 mu m thick multiple quantum well structure, shows a change in reflection from about 75% to 10% at approximately=865 nm when biased from 0 to -10 V. To obtain even higher changes in transmission or reflection and to utilise the electro-refractive properties of the material, high finesse cavities are needed. This however, appears to impose severe constraints on the epitaxial growth accuracy and operational stability of such devices.<>
  • Keywords
    III-V semiconductors; aluminium compounds; electroabsorption; electroreflectance; gallium arsenide; optical modulation; reflectivity; semiconductor quantum wells; Fabry-Perot etalon; GaAs-AlGaAs; III-V semiconductors; electro-absorption; electro-refractive properties; epitaxial growth; multiple quantum well modulators; operational stability; reflection; reflectivity; transmission; Aluminum compounds; Electroabsorption; Gallium compounds; Optical modulation; Optical reflection; Quantum wells;
  • fLanguage
    English
  • Journal_Title
    Optoelectronics, IEE Proceedings J
  • Publisher
    iet
  • ISSN
    0267-3932
  • Type

    jour

  • Filename
    14496