Title :
Apparent interface state density introduced by the spatial fluctuations of surface potential in an m.o.s. structure
Author :
Castagne, R. ; Vapaille, A.
Author_Institution :
Institut d´Electronique Fondamentale, Laboraroire associé au CRNS, Faculté des Sciences, Orsay, France
Abstract :
The authors report experimental results in support of probabilistic theory to show that spatial fluctuations of the oxide built-in charge are effectively responsible for surface potential fluctuations, which result in an apparent density of interface states increasing with the mean image charge.
Keywords :
metal-insulator-semiconductor devices; metal-insulator-semiconductor structures; surface phenomena;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19700481