Title :
A O(t3+|E|) fault identification algorithm for diagnosable systems
Author :
Sullivan, Gregory F.
Author_Institution :
Dept. of Comput. Sci., Johns Hopkins Univ., Baltimore, MD, USA
fDate :
4/1/1988 12:00:00 AM
Abstract :
Systems composed of many processing units can use these units to help perform self-diagnosis. An algorithm is presented that performs this type of diagnosis for the system-level fault model. The time complexity of the algorithm is O(t3+|E|), where |E| is the number of tests and t is the number of allowed faults. When t is small relative to the total number of system components n, this is the tightest known time bound; when t is O(n5/6) this is the best bound
Keywords :
fault tolerant computing; diagnosable systems; fault identification algorithm; time complexity; Built-in self-test; Computer science; Fault diagnosis; Hardware; Labeling; Performance evaluation; System testing;
Journal_Title :
Computers, IEEE Transactions on
