Title :
Statistical properties of linear multi-category pattern classifiers based on the least-mean-square error criterion (Corresp.)
Author :
Yau, Stephen ; Chuang, P.
fDate :
9/1/1968 12:00:00 AM
Keywords :
Least-squares optimization; Pattern classification; Biometrics; Bismuth; Computer aided software engineering; Error analysis; Probability; Statistical analysis; Statistics; Taylor series; Testing; Vectors;
Journal_Title :
Information Theory, IEEE Transactions on
DOI :
10.1109/TIT.1968.1054203
