Title :
Microprocessors functional testing techniques
Author :
Talkhan, El-Sayed A. ; Ahmed, Aly M H ; Salama, Aly E.
Author_Institution :
Dept. of Electron. & Commun., Cairo Univ., Giza, Egypt
fDate :
3/1/1989 12:00:00 AM
Abstract :
The authors address the functional testing of microprocessors. A method is introduced for obtaining a minimum set of instructions that replaces the whole instruction set during testing procedure. The method is illustrated on the digital signal processor TM32010
Keywords :
computer testing; microprocessor chips; TM32010; digital signal processor; functional testing techniques; minimum set; testing procedure; Circuits; Communication system control; Decoding; Digital signal processors; Microprocessors; Pins; Registers; Signal processing; Testing; Timing;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
