• DocumentCode
    911377
  • Title

    Microprocessors functional testing techniques

  • Author

    Talkhan, El-Sayed A. ; Ahmed, Aly M H ; Salama, Aly E.

  • Author_Institution
    Dept. of Electron. & Commun., Cairo Univ., Giza, Egypt
  • Volume
    8
  • Issue
    3
  • fYear
    1989
  • fDate
    3/1/1989 12:00:00 AM
  • Firstpage
    316
  • Lastpage
    318
  • Abstract
    The authors address the functional testing of microprocessors. A method is introduced for obtaining a minimum set of instructions that replaces the whole instruction set during testing procedure. The method is illustrated on the digital signal processor TM32010
  • Keywords
    computer testing; microprocessor chips; TM32010; digital signal processor; functional testing techniques; minimum set; testing procedure; Circuits; Communication system control; Decoding; Digital signal processors; Microprocessors; Pins; Registers; Signal processing; Testing; Timing;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.21850
  • Filename
    21850
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=911377