• DocumentCode
    911554
  • Title

    Possible relation between the low-level attenuation constant or ΔHeff and ΔHk

  • Author

    Ogasawara, N. ; Sawado, E.

  • Author_Institution
    Tokyo Metropolitan University, Tokyo, Japan
  • Volume
    6
  • Issue
    24
  • fYear
    1970
  • Firstpage
    761
  • Abstract
    It is deduced from a theoretical model that the effective linewidth or low-level attenuation constant increases in proportion to the reciprocal of the spin-wave linewidth when the latter exceeds a certain minimum.
  • Keywords
    ferrites; microwave devices; microwave measurement;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19700526
  • Filename
    4235033
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=911554