Title :
Possible relation between the low-level attenuation constant or ΔHeff and ΔHk
Author :
Ogasawara, N. ; Sawado, E.
Author_Institution :
Tokyo Metropolitan University, Tokyo, Japan
Abstract :
It is deduced from a theoretical model that the effective linewidth or low-level attenuation constant increases in proportion to the reciprocal of the spin-wave linewidth when the latter exceeds a certain minimum.
Keywords :
ferrites; microwave devices; microwave measurement;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19700526
