• DocumentCode
    911590
  • Title

    Measurement of thermal resistance using electrical methods

  • Author

    Webb, P.W.

  • Author_Institution
    University of Birmingham, Department of Electronic and Electrical Engineering, Birmingham, UK
  • Volume
    134
  • Issue
    2
  • fYear
    1987
  • fDate
    4/1/1987 12:00:00 AM
  • Firstpage
    51
  • Lastpage
    56
  • Abstract
    The electrical method of measuring thermal resistance is examined in detail and compared with results obtained using infra-red thermal imaging. It is shown that the measurement of thermal resistance using electrical methods can be very inaccurate, particularly when used to measure multicell structures or very large area devices.
  • Keywords
    semiconductor device testing; thermal resistance measurement; electrical methods; multicell structures; semiconductor devices; thermal resistance measurement; very large area devices;
  • fLanguage
    English
  • Journal_Title
    Solid-State and Electron Devices, IEE Proceedings I
  • Publisher
    iet
  • ISSN
    0143-7100
  • Type

    jour

  • DOI
    10.1049/ip-i-1.1987.0007
  • Filename
    4644293
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=911590