Title :
Measurement of thermal resistance using electrical methods
Author_Institution :
University of Birmingham, Department of Electronic and Electrical Engineering, Birmingham, UK
fDate :
4/1/1987 12:00:00 AM
Abstract :
The electrical method of measuring thermal resistance is examined in detail and compared with results obtained using infra-red thermal imaging. It is shown that the measurement of thermal resistance using electrical methods can be very inaccurate, particularly when used to measure multicell structures or very large area devices.
Keywords :
semiconductor device testing; thermal resistance measurement; electrical methods; multicell structures; semiconductor devices; thermal resistance measurement; very large area devices;
Journal_Title :
Solid-State and Electron Devices, IEE Proceedings I
DOI :
10.1049/ip-i-1.1987.0007
