DocumentCode
911620
Title
The1975 S-MTT National Lectureship, Dec. 1975
Author
Beatty, Robert W.
Volume
23
Issue
12
fYear
1975
fDate
12/1/1975 12:00:00 AM
Firstpage
952
Lastpage
952
Abstract
The development of modern computer-controlled measurement systems has given the microwave engineer a fantastic tool for the design and testing of components and systems. Going beyond the point of fast, automatic measurements, they now give promise of high accuracy and are revolutionizing the microwave measurement field.
Keywords
Computer displays; Helium; IEC standards; Instruments; Laboratories; Microwave measurements; NIST; Pulse measurements; Radar; Software measurement;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.1975.1128726
Filename
1128726
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