DocumentCode :
911859
Title :
Nondestructive Measurement of Complex Permittivity for Dielectric Slabs (Short Papers)
Author :
Decreton, Marc C. ; Ramachandraiah, Munikoti S.
Volume :
23
Issue :
12
fYear :
1975
fDate :
12/1/1975 12:00:00 AM
Firstpage :
1077
Lastpage :
1080
Abstract :
A method has been developed for the precise nondestructive measurement of the dielectric constant and losses of slab-like samples such as microstrip substrates, for instance. Basically, the test setup consists of an open-ended rectangular waveguide, the flange of which is placed in contact with one side of the dielectric material, the other one being backed by a metal plate. The waveguide can be either simply cut at its end, or terminated by an inductive or capacitive iris. The reflection characteristics or the resonance parameters are related to the real and imaginary parts of the permittivity by means of computer-generated charts or an optimization program.
Keywords :
Dielectric constant; Dielectric loss measurement; Dielectric measurements; Dielectric substrates; Loss measurement; Materials testing; Microstrip; Permittivity measurement; Rectangular waveguides; Slabs;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1975.1128749
Filename :
1128749
Link To Document :
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