Title :
A reconfiguration scheme for yield enhancement of large area binary tree architectures
Author :
Howells, Michael C. ; Agarwal, Vinod K.
Author_Institution :
Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
fDate :
4/1/1988 12:00:00 AM
Abstract :
A reconfiguration scheme is presented that is suitable for both yield and reliability enhancement of large-area VLSI implementations of binary tree architectures. The approach proposed makes use of partially global redundancy to allow clustered effects to be tolerated. The binary tree is cut a few levels above the leaves to form an upper subtree and many lower subtrees, with spare processors being grouped adjacent to the root of each lower subtree. Redundant links with programmable switches are used to permit reconfiguration. The cost of the scheme, in terms of redundant hardware, is comparable to that of other schemes. An O(N ) H-tree layout is used. In comparison to existing schemes, the proposed scheme gives much better yield and better reliability
Keywords :
computer architecture; fault tolerant computing; trees (mathematics); VLSI; large area binary tree architectures; partially global redundancy; programmable switches; reconfiguration scheme; reliability enhancement; yield enhancement; Binary trees; Circuit faults; Computer architecture; Concurrent computing; Costs; Fabrication; Hardware; Redundancy; Switches; Very large scale integration;
Journal_Title :
Computers, IEEE Transactions on