DocumentCode :
911951
Title :
Modeling Latch-Up in CMOS Integrated Circuits
Author :
Estreich, Donald B. ; Dutton, Robert W.
Author_Institution :
Hewlett-Packard Company, Santa Rosa, CA, USA
Volume :
1
Issue :
4
fYear :
1982
fDate :
10/1/1982 12:00:00 AM
Firstpage :
157
Lastpage :
162
Abstract :
Latch-up is a common problem in CMOS integrated circuits. The modeling of latch-up with circuit simulation programs is addressed in this paper. The general features of a lumped element latch-up model are discussed along with a step-by-step approach to the component determination of the model. An example is presented to show the value of the latch-up model in latch-up threshold prediction. Finally, some latch-up control methods are discussed.
Keywords :
CMOS integrated circuits; Equivalent circuits; Integrated circuit modeling; Inverters; Ionizing radiation; Latches; Physics; Predictive models; Semiconductor device modeling; Voltage;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.1982.1270006
Filename :
1270006
Link To Document :
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