Title :
Modeling Latch-Up in CMOS Integrated Circuits
Author :
Estreich, Donald B. ; Dutton, Robert W.
Author_Institution :
Hewlett-Packard Company, Santa Rosa, CA, USA
fDate :
10/1/1982 12:00:00 AM
Abstract :
Latch-up is a common problem in CMOS integrated circuits. The modeling of latch-up with circuit simulation programs is addressed in this paper. The general features of a lumped element latch-up model are discussed along with a step-by-step approach to the component determination of the model. An example is presented to show the value of the latch-up model in latch-up threshold prediction. Finally, some latch-up control methods are discussed.
Keywords :
CMOS integrated circuits; Equivalent circuits; Integrated circuit modeling; Inverters; Ionizing radiation; Latches; Physics; Predictive models; Semiconductor device modeling; Voltage;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.1982.1270006