DocumentCode :
911991
Title :
Temperature dependence of threshold current of In1-x GaxAsyP1-y lasers with different compositions
Author :
Haug, A. ; Burkhard, H.
Author_Institution :
Max-Planck-Institut f¿¿r Festk¿¿rperforschung, Stuttgart, West Germany
Volume :
134
Issue :
2
fYear :
1987
fDate :
4/1/1987 12:00:00 AM
Firstpage :
117
Lastpage :
121
Abstract :
Measurements of the temperature dependence of the threshold current of InGaAsP/InP lasers are presented for compositions with wavelengths ¿¿ = 1.55 and 1.65 ¿¿m. 1.55 ¿¿m lasers have been investigated with either three or four epitaxial layers to study the influence of leakage currents. The experimental results are compared with theoretical investigations which are based on the assumption that Auger recombination is responsible for the temperature behaviour. The calculation of the Auger processes is reinvestigated. Fair agreement between experiment and theory demonstrates that Auger processes are the main cause for the temperature sensitivity of InGaAsP lasers.
Keywords :
Auger effect; III-V semiconductors; gallium arsenide; indium compounds; semiconductor junction lasers; 1.55 micron; 1.65 micron; Auger recombination; InGaAsP-InP; composition dependence; epitaxial layers; leakage currents; temperature dependence; threshold current;
fLanguage :
English
Journal_Title :
Optoelectronics, IEE Proceedings J
Publisher :
iet
ISSN :
0267-3932
Type :
jour
DOI :
10.1049/ip-j.1987.0019
Filename :
4644336
Link To Document :
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