• DocumentCode
    912131
  • Title

    A New Automatic Logic Interconnection Verification System for VLSI Design

  • Author

    Watanabe, Takashi ; Endo, Makoto ; Miyahara, Norio

  • Author_Institution
    Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation, Tokyo, Japan
  • Volume
    2
  • Issue
    2
  • fYear
    1983
  • fDate
    4/1/1983 12:00:00 AM
  • Firstpage
    70
  • Lastpage
    82
  • Abstract
    A new VLSI checking program, LIVES (Logic Interconnection VErification System), has been developed. LIVES verifies the geometrical layout data to determine whether or not it correctly reflects the original logic level description. An excellent LIVES feature, which no other programs have possessed yet, is that it can perform the check even when there are no identification marks on each logic gate in layout level description data. This feature is realized by employing new algorithms based on graph theory. In the verification procedure, LIVES Adopts graph isomorphism, which uses the new partitioning methods for vertices, especially tailored for the logic diagram. In the error detection procedure, a graph is divided into subgraphs, based on a new concept, "route-subgraph," and tests for graph isomorphism between subgraphs are performed. These algorithms enable precise and rapid search for any error points in the VLSI design. These new algorithms have been implemented and examined for practical feasibility. Experimental results have ensured that this program can detect errors in the VLSI layout patterns very quickly and precisely. LIVES will be a highly efficient tool in VLSI logic design by using it systematically combined with other CAD programs.
  • Keywords
    Algorithm design and analysis; Automatic logic units; Design automation; Graph theory; Logic design; Logic gates; Partitioning algorithms; Performance evaluation; Testing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.1983.1270023
  • Filename
    1270023