Title :
On the current density dependence of electromigration in thin films
Author :
Hofman, G.L. ; Breitling, H.M.
fDate :
5/1/1970 12:00:00 AM
Abstract :
Comments are made on a recently publicized theory on electromigration in thin films. It is shown that the rate of electromigration is a linear function of the current density and not a quadratic function as proposed by Black.
Keywords :
Aluminum; Crystallization; Current density; Electromigration; Electrons; History; Oscillators; Solids; Spectral analysis; Transistors;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1970.7772
