Title :
A Data Base Driven Automated System for MOS Device Characterization, Parameter Optimization and Modeling
Author :
Melstrand, Orlin ; O´Neill, Ed ; Sobelman, Gerald E. ; Dokos, Dimitri
Author_Institution :
Sperry Semiconductor Operations, Eagan, MN, USA
fDate :
1/1/1984 12:00:00 AM
Abstract :
An automated system has been developed for use in the characterization and modeling of MOS transistors. The system, consisting of automatic testing, a dynamic data base, and device parameter extraction, has been applied to process characterization and device modeling. The data base handles storage and retrieval of the data. Parameter extraction is based on optimization with constraints.
Keywords :
Automatic testing; Circuit testing; Design automation; Information retrieval; MOS devices; Microcomputers; Monitoring; Parameter extraction; Software testing; System testing;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.1984.1270056
