• DocumentCode
    912463
  • Title

    A Data Base Driven Automated System for MOS Device Characterization, Parameter Optimization and Modeling

  • Author

    Melstrand, Orlin ; O´Neill, Ed ; Sobelman, Gerald E. ; Dokos, Dimitri

  • Author_Institution
    Sperry Semiconductor Operations, Eagan, MN, USA
  • Volume
    3
  • Issue
    1
  • fYear
    1984
  • fDate
    1/1/1984 12:00:00 AM
  • Firstpage
    47
  • Lastpage
    51
  • Abstract
    An automated system has been developed for use in the characterization and modeling of MOS transistors. The system, consisting of automatic testing, a dynamic data base, and device parameter extraction, has been applied to process characterization and device modeling. The data base handles storage and retrieval of the data. Parameter extraction is based on optimization with constraints.
  • Keywords
    Automatic testing; Circuit testing; Design automation; Information retrieval; MOS devices; Microcomputers; Monitoring; Parameter extraction; Software testing; System testing;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.1984.1270056
  • Filename
    1270056
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=912463