Title : 
Heterostructure semiconductor Raman laser
         
        
            Author : 
Suto, K. ; Kimura, T. ; Nishizawa, J.
         
        
            Author_Institution : 
Tohoku University, Research Institute of Electrical Communication, Sendai, Japan
         
        
        
        
        
            fDate : 
8/1/1987 12:00:00 AM
         
        
        
        
            Abstract : 
This paper describes the first lasing experiment of the heterostructure semiconductor Raman laser with a GaP Raman active layer as thin as 15 ¿¿m and AlxGa1¿¿xP cladding layers for optical confinement, which should be a step towards realising a semiconductor Raman laser pumped by a semiconductor injection laser applicable to wideband optical communication. Also, the four-layer structure Raman laser is reported, by which the strain-induced optical anisotropy caused by the lattice mismatching can be reduced.
         
        
            Keywords : 
III-V semiconductors; Raman lasers; aluminium compounds; gallium compounds; semiconductor junction lasers; 15 micron; AlxGa1-xP cladding layers; GaP Raman active layer; GaP-AlxGa1-xP; four-layer structure Raman laser; heterostructure semiconductor Raman laser; lattice mismatching; optical confinement; semiconductor injection laser; semiconductors; strain-induced optical anisotropy; wideband optical communication;
         
        
        
            Journal_Title : 
Optoelectronics, IEE Proceedings J
         
        
        
        
        
            DOI : 
10.1049/ip-j.1987.0038