Title :
SEU Measurements Using 252Cf Fission Particles, on CMOS Static RAMs, Subjected to a Continuous Period of Low Dose Rate 60Co Irradiation
Author :
Sanderson, T.K. ; Mapper, D. ; Stephen, J.H. ; Farren, J. ; Adams, L. ; Harboe-Sorensen, R.
Author_Institution :
Instrumentation and Applied Physics Division, Harwell Laboratory, Ukaea, UK
Abstract :
SEU measurements have been made on a number of CMOS static RAMs over a period of eight months while they were being continuously irradiated with 60 Co gamma rays. The results are discussed and compared with those of other workers using different methods.
Keywords :
Extraterrestrial measurements; Gamma rays; Helium; Instruments; Particle measurements; Performance evaluation; Satellites; Single event upset; Testing; Very large scale integration;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1987.4337467
