Title :
A new integrated gate eliminating line reflections in high-speed digital systems
Author :
Abdel-Latif, M. ; Strutt, M.J.O.
fDate :
6/1/1970 12:00:00 AM
Abstract :
Difficulties caused by reflections on lines connecting high-speed integrated circuits could be totally eliminated by proper matching of these lines. A new integrated matching gate (IMG) has been developed for this purpose. A special arrangement is suggested using these new gates in large digital systems in order to eliminate line reflections without affecting the maximum fan-out capacity.
Keywords :
Digital systems; Diodes; High speed integrated circuits; Integrated circuit noise; Joining processes; Logic devices; Power generation; Reflection; Temperature; Voltage;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1970.7816
