Performance limits in TDR technique by Monte Carlo simulation

Author

Letosa, J. ; García-gracia, M. ; Forniés-Marquina, J.M. ; Artacho, J.M.

Author_Institution

Dept. de Ingenieria Electr., Electron. y Commun., Zaragoza Univ., Spain

Volume

32

Issue

3

fYear

1996

fDate

5/1/1996 12:00:00 AM

Firstpage

958

Lastpage

961

Abstract

This paper researches the performance limits on the estimation of the electromagnetic properties of dielectrics with characteristic times of up to 10 ps using time domain techniques. Constructions of random values with correlation among those, supporting high-fidelity Monte Carlo simulations, are addressed. Precision of the magnitudes under test is obtained, this result is required to evaluate the optimal method. It is shown how a simulated noise restricted to the system bandwidth is sufficient to characterise the errors

Keywords

Monte Carlo methods; dielectric measurement; digital simulation; error analysis; measurement errors; noise; simulation; time-domain reflectometry; 10 ps; Monte Carlo simulation; TDR technique; characteristic times; correlation; dielectrics; electromagnetic properties; errors; high-fidelity Monte Carlo simulations; magnitudes under test; optimal method; performance limits; random values; simulated noise; system bandwidth; time domain techniques; Bandwidth; Coaxial components; Deconvolution; Dielectric measurements; Dielectrics; Permittivity; Polarization; Testing; Time measurement; Transmission line matrix methods; Voltage;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.497401

Filename

497401