• DocumentCode
    912670
  • Title

    Single-Event Upset (SEU) in a Dram with On-Chip Error Correction

  • Author

    Zoutendyk, J.A. ; Schwartz, H.R. ; Watson, R.K. ; Hasnain, Z. ; Nevill, L.R.

  • Author_Institution
    Jet Propulsion Laboratory California Institute of Technology Pasadena, California 91109
  • Volume
    34
  • Issue
    6
  • fYear
    1987
  • Firstpage
    1310
  • Lastpage
    1315
  • Abstract
    The results are given of the first SEU measurements ever reported on IC devices with on-chip error correction. This method of SEU abatement could revolutionize the design of SEU-immune electronic systems.
  • Keywords
    Computer errors; Error correction; Error correction codes; Iron; Laboratories; MOS capacitors; MOS devices; Propulsion; Random access memory; Single event upset;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1987.4337471
  • Filename
    4337471
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=912670