Title :
Single-Event Upset (SEU) in a Dram with On-Chip Error Correction
Author :
Zoutendyk, J.A. ; Schwartz, H.R. ; Watson, R.K. ; Hasnain, Z. ; Nevill, L.R.
Author_Institution :
Jet Propulsion Laboratory California Institute of Technology Pasadena, California 91109
Abstract :
The results are given of the first SEU measurements ever reported on IC devices with on-chip error correction. This method of SEU abatement could revolutionize the design of SEU-immune electronic systems.
Keywords :
Computer errors; Error correction; Error correction codes; Iron; Laboratories; MOS capacitors; MOS devices; Propulsion; Random access memory; Single event upset;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1987.4337471
